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1 Ergebnisse
1
Effects of Floating Gate Profile on Cell Characteristics of..:
, In:
2023 China Semiconductor Technology International Conference (CSTIC)
,
Chen, Hualun
;
Du, Yihang
;
Gu, Lin
... - p. 1-3 , 2023
Link:
https://doi.org/10.1109/CSTIC58779.2023.10219220
RT T1 <cTitle>2023 China Semiconductor Technology International Conference (CSTIC)</cTitle>: T1 <Title>Effects of Floating Gate Profile on Cell Characteristics of 4XNM FG-First ETOX Nor Flash Memory</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10219220&Exemplar=1&LAN=DE A1 Chen, Hualun A1 Du, Yihang A1 Gu, Lin A1 Wang, Zhuangzhuang A1 Yao, Chun A1 Xu, Zhaozhao YR 2023 K1 Couplings K1 Nonvolatile memory K1 Dry etching K1 Electric variables K1 Threshold voltage K1 Flash memories SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/CSTIC58779.2023.10219220 DO https://doi.org/10.1109/CSTIC58779.2023.10219220 SF ELIB - SuUB Bremen
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