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1 Ergebnisse
1
A Study of Parasitic Capacitance Using Different Bit Line S..:
, In:
2023 China Semiconductor Technology International Conference (CSTIC)
,
Deng, Dempsey
;
Wang, Qingpeng
;
Zhong, Yujia
.. - p. 1-3 , 2023
Link:
https://doi.org/10.1109/CSTIC58779.2023.10219297
RT T1 <cTitle>2023 China Semiconductor Technology International Conference (CSTIC)</cTitle>: T1 <Title>A Study of Parasitic Capacitance Using Different Bit Line Spacer Integration Schemes in Advanced DRAM</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10219297&Exemplar=1&LAN=DE A1 Deng, Dempsey A1 Wang, Qingpeng A1 Zhong, Yujia A1 Chen, Yu De A1 Huang, Jacky YR 2023 K1 Performance evaluation K1 Legged locomotion K1 Sensitivity K1 Process modeling K1 Air gaps K1 Random access memory K1 Market research SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/CSTIC58779.2023.10219297 DO https://doi.org/10.1109/CSTIC58779.2023.10219297 SF ELIB - SuUB Bremen
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