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1 Ergebnisse
1
Neutron Irradiation Induced Carrier Removal and Deep-Level ..:
, In:
2023 China Semiconductor Technology International Conference (CSTIC)
,
Sui, Jin
;
Chen, Jiaxiang
;
Qu, Haolan
... - p. 1-3 , 2023
Link:
https://doi.org/10.1109/CSTIC58779.2023.10219301
RT T1 <cTitle>2023 China Semiconductor Technology International Conference (CSTIC)</cTitle>: T1 <Title>Neutron Irradiation Induced Carrier Removal and Deep-Level Traps in N-Gan Schottky Barrier Diodes</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10219301&Exemplar=1&LAN=DE A1 Sui, Jin A1 Chen, Jiaxiang A1 Qu, Haolan A1 Zhang, Ruohan A1 Zhu, Min A1 Lu, Xing A1 Zou, Xinbo YR 2023 K1 Radiation effects K1 Schottky diodes K1 Spectroscopy K1 Schottky barriers K1 Neutrons K1 Threshold voltage K1 Leakage currents SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/CSTIC58779.2023.10219301 DO https://doi.org/10.1109/CSTIC58779.2023.10219301 SF ELIB - SuUB Bremen
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