I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Reliability Research on micro bump and c4bump in Large-Size..:

, In: 2023 China Semiconductor Technology International Conference (CSTIC),
Li, Xiang ; Wang, Zhuqiu ; He, Xiao.. - p. 1-4 , 2023
Link: https://doi.org/10.1109/CSTIC58779.2023.10219324