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1 Ergebnisse
1
High Endurance Sonos Technology Improved by Design & Proces..:
, In:
2023 China Semiconductor Technology International Conference (CSTIC)
,
Zhou, Pingsheng
;
Zhang, Kegang
;
Li, Gordon
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/CSTIC58779.2023.10219344
RT T1
2023 China Semiconductor Technology International Conference (CSTIC)
: T1
High Endurance Sonos Technology Improved by Design & Process Optimization
UL https://suche.suub.uni-bremen.de/peid=ieee-10219344&Exemplar=1&LAN=DE A1 Zhou, Pingsheng A1 Zhang, Kegang A1 Li, Gordon A1 Chen, Hualun A1 Yao, Xiang A1 Kong, Weiran YR 2023 K1 SONOS devices K1 Performance evaluation K1 Degradation K1 Voltage K1 Implants K1 Reliability engineering K1 Manufacturing K1 SONOS memory K1 high endurance K1 SONOS cell VT window K1 reliability SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/CSTIC58779.2023.10219344 DO https://doi.org/10.1109/CSTIC58779.2023.10219344 SF ELIB - SuUB Bremen
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