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1 Ergebnisse
1
Application of Picosecond Ultrasonic Technology for CMOS Im..:
, In:
2023 China Semiconductor Technology International Conference (CSTIC)
,
Mu, Johnny
;
Song, Kaixing
;
Jin, Johnny
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/CSTIC58779.2023.10219348
RT T1 <cTitle>2023 China Semiconductor Technology International Conference (CSTIC)</cTitle>: T1 <Title>Application of Picosecond Ultrasonic Technology for CMOS Image Sensors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10219348&Exemplar=1&LAN=DE A1 Mu, Johnny A1 Song, Kaixing A1 Jin, Johnny A1 Kim, Cheolkyu A1 Huang, Yaodong A1 Hong, Hong YR 2023 K1 Semiconductor device measurement K1 Ultrasonic variables measurement K1 Pulse measurements K1 Dry etching K1 Process control K1 CMOS image sensors K1 Acoustics SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/CSTIC58779.2023.10219348 DO https://doi.org/10.1109/CSTIC58779.2023.10219348 SF ELIB - SuUB Bremen
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