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1 Ergebnisse
1
The method of improving data retention for Logic Flash:
, In:
2022 10th International Symposium on Next-Generation Electronics (ISNE)
,
Wang, Dejin
;
Sun, Xiaofeng
;
Li, Zongyuan
.. - p. 1-3 , 2023
Link:
https://doi.org/10.1109/ISNE56211.2023.10221579
RT T1
2022 10th International Symposium on Next-Generation Electronics (ISNE)
: T1
The method of improving data retention for Logic Flash
UL https://suche.suub.uni-bremen.de/peid=ieee-10221579&Exemplar=1&LAN=DE A1 Wang, Dejin A1 Sun, Xiaofeng A1 Li, Zongyuan A1 Ye, Fan A1 Lin, Zhengyu YR 2023 SN 2378-8607 K1 Annealing K1 Statistical analysis K1 Capacitors K1 Logic gates K1 Dielectrics K1 Flash memories K1 Chemicals K1 Logic Flash K1 Data Retention K1 Capacitor Dielectric SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/ISNE56211.2023.10221579 DO https://doi.org/10.1109/ISNE56211.2023.10221579 SF ELIB - SuUB Bremen
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