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1 Ergebnisse
1
Enhancement-mode AlGaN/GaN HEMTs with a semi-wraparound met..:
, In:
2022 10th International Symposium on Next-Generation Electronics (ISNE)
,
Jia, Mao
;
Hou, Bin
;
Jia, Fu-Chun
... - p. 1-3 , 2023
Link:
https://doi.org/10.1109/ISNE56211.2023.10221606
RT T1
2022 10th International Symposium on Next-Generation Electronics (ISNE)
: T1
Enhancement-mode AlGaN/GaN HEMTs with a semi-wraparound metal-insulator-semiconductor gate
UL https://suche.suub.uni-bremen.de/peid=ieee-10221606&Exemplar=1&LAN=DE A1 Jia, Mao A1 Hou, Bin A1 Jia, Fu-Chun A1 Yang, Ling A1 Ao, Jin-Ping A1 Ma, Xiao-Hua YR 2023 SN 2378-8607 K1 Resistance K1 Performance evaluation K1 Logic gates K1 HEMTs K1 Threshold voltage K1 Wide band gap semiconductors K1 MODFETs K1 Normally-off K1 p-GaN HEMT K1 DC characteristics SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/ISNE56211.2023.10221606 DO https://doi.org/10.1109/ISNE56211.2023.10221606 SF ELIB - SuUB Bremen
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