I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Off-State Characteristics of Polycrystalline Silicon Thin-F..:
, In:
2022 10th International Symposium on Next-Generation Electronics (ISNE)
,
Zhang, Meng
;
Jiang, Zhendong
;
Tien, Ching-Ho
... - p. 1-3 , 2023
Link:
https://doi.org/10.1109/ISNE56211.2023.10221637
RT T1 <cTitle>2022 10th International Symposium on Next-Generation Electronics (ISNE)</cTitle>: T1 <Title>Off-State Characteristics of Polycrystalline Silicon Thin-Film Transistors under Self-Heating Stress</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10221637&Exemplar=1&LAN=DE A1 Zhang, Meng A1 Jiang, Zhendong A1 Tien, Ching-Ho A1 Chen, Lung-Chien A1 Wong, Man A1 Kwok, Hoi-Sing YR 2023 SN 2378-8607 K1 Degradation K1 Voltage K1 Logic gates K1 Silicon K1 Thin film transistors K1 Transistors K1 Junctions K1 Off state current K1 Self-heating K1 Poly-Si K1 Thin film transistor SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/ISNE56211.2023.10221637 DO https://doi.org/10.1109/ISNE56211.2023.10221637 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
