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1 Ergebnisse
1
Excess noise characterization of all-silicon avalanche phot..:
, In:
2023 Photonics North (PN)
,
Xie, Yanran
;
Das, Ranjan
;
Knights, Andrew
- p. 1-1 , 2023
Link:
https://doi.org/10.1109/PN58661.2023.10222997
RT T1
2023 Photonics North (PN)
: T1
Excess noise characterization of all-silicon avalanche photodetectors for telecommunication bandwidths
UL https://suche.suub.uni-bremen.de/peid=ieee-10222997&Exemplar=1&LAN=DE A1 Xie, Yanran A1 Das, Ranjan A1 Knights, Andrew YR 2023 SN 2693-8316 K1 Data centers K1 Bandwidth K1 Avalanche photodiodes K1 Gain measurement K1 Silicon K1 Photodetectors K1 Communications technology K1 Si photonics K1 all-Si detectors K1 avalanche photodetector K1 excess noise factor K1 telecommunication SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/PN58661.2023.10222997 DO https://doi.org/10.1109/PN58661.2023.10222997 SF ELIB - SuUB Bremen
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