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Radiation Hardness Evaluations of a Stacked Flip Flop in a ..:
, In:
2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)
,
Sugitani, Shotaro
;
Nakajima, Ryuichi
;
Ito, Takafumi
... - p. 1-5 , 2023
Link:
https://doi.org/10.1109/IOLTS59296.2023.10224879
RT T1
2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)
: T1
Radiation Hardness Evaluations of a Stacked Flip Flop in a 22 nm FD-SOI Process by Heavy-Ion Irradiation
UL https://suche.suub.uni-bremen.de/peid=ieee-10224879&Exemplar=1&LAN=DE A1 Sugitani, Shotaro A1 Nakajima, Ryuichi A1 Ito, Takafumi A1 Furuta, Jun A1 Kobayashi, Kazutoshi A1 Louvat, Mathieu A1 Jacquet, Francois A1 Eloy, Jean-Christophe A1 Montfort, Olivier A1 Jure, Lionel A1 Huard, Vincent YR 2023 SN 1942-9401 K1 Radiation effects K1 MOSFET K1 Low voltage K1 Silicon-on-insulator K1 Voltage K1 System analysis and design K1 Substrates K1 single event effects K1 soft error K1 heavy ion K1 FDSOI K1 radiation hard K1 flip-well K1 flip-flop SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IOLTS59296.2023.10224879 DO https://doi.org/10.1109/IOLTS59296.2023.10224879 SF ELIB - SuUB Bremen
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