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Radiation Hardness Evaluations of a Stacked Flip Flop in a ..:

, In: 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS),
Sugitani, Shotaro ; Nakajima, Ryuichi ; Ito, Takafumi... - p. 1-5 , 2023
Link: https://doi.org/10.1109/IOLTS59296.2023.10224879