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1 Ergebnisse
1
Minimum SRAM Retention Voltage: Insight about optimizing Po..:
, In:
2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)
,
Aslan, Y. E.
;
Cacho, F.
;
Kumar, T.
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/IOLTS59296.2023.10224895
RT T1
2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)
: T1
Minimum SRAM Retention Voltage: Insight about optimizing Power Efficiency across Temperature Profile, Process Variation and Aging
UL https://suche.suub.uni-bremen.de/peid=ieee-10224895&Exemplar=1&LAN=DE A1 Aslan, Y. E. A1 Cacho, F. A1 Kumar, T. A1 Janardan, D. K. A1 Kumar, A. A1 Giner, F. A1 Faurichon, M. A1 Anghel, L. YR 2023 SN 1942-9401 K1 Temperature measurement K1 Temperature distribution K1 Temperature dependence K1 Current measurement K1 Thermal variables control K1 Simulation K1 Random access memory K1 Data retention K1 Reliability K1 SRAM K1 Aging SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IOLTS59296.2023.10224895 DO https://doi.org/10.1109/IOLTS59296.2023.10224895 SF ELIB - SuUB Bremen
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