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1 Ergebnisse
1
About the Correlation between Logical Identified Faulty Gat..:
, In:
2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)
,
Bernardi, P.
;
Cardone, L.
;
Iaria, G.
... - p. 1-7 , 2023
Link:
https://doi.org/10.1109/IOLTS59296.2023.10224897
RT T1
2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)
: T1
About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics
UL https://suche.suub.uni-bremen.de/peid=ieee-10224897&Exemplar=1&LAN=DE A1 Bernardi, P. A1 Cardone, L. A1 Iaria, G. A1 Appello, D. A1 Garozzo, G. A1 Tancorre, V. YR 2023 SN 1942-9401 K1 Fault diagnosis K1 Correlation K1 Layout K1 Electronic components K1 Production K1 Logic gates K1 Silicon K1 Manufacturing Test K1 Reliability SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/IOLTS59296.2023.10224897 DO https://doi.org/10.1109/IOLTS59296.2023.10224897 SF ELIB - SuUB Bremen
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