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About the Correlation between Logical Identified Faulty Gat..:

, In: 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS),
Bernardi, P. ; Cardone, L. ; Iaria, G.... - p. 1-7 , 2023
Link: https://doi.org/10.1109/IOLTS59296.2023.10224897