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1 Ergebnisse
1
Recurrent Neural Network for M/EEG Source Localization:
, In:
2023 IEEE 24th International Conference of Young Professionals in Electron Devices and Materials (EDM)
,
Vakhitov, Rodion R.
;
Khlopkov, Artem D.
;
Lukin, Alexander S.
... - p. 1350-1353 , 2023
Link:
https://doi.org/10.1109/EDM58354.2023.10225127
RT T1 <cTitle>2023 IEEE 24th International Conference of Young Professionals in Electron Devices and Materials (EDM)</cTitle>: T1 <Title>Recurrent Neural Network for M/EEG Source Localization</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10225127&Exemplar=1&LAN=DE A1 Vakhitov, Rodion R. A1 Khlopkov, Artem D. A1 Lukin, Alexander S. A1 Toma, Vladislav V. A1 Snytkin, Alexander E. A1 Kulikov, Roman S. YR 2023 SN 2325-419X K1 Location awareness K1 Machine learning algorithms K1 Recurrent neural networks K1 Inverse problems K1 Time series analysis K1 Markov processes K1 Brain modeling K1 MEG K1 Recurrent Neural Network K1 classification model K1 machine learning K1 source localization K1 inverse solutions K1 brain imaging SP 1350 OP 1353 LK http://dx.doi.org/https://doi.org/10.1109/EDM58354.2023.10225127 DO https://doi.org/10.1109/EDM58354.2023.10225127 SF ELIB - SuUB Bremen
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