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1 Ergebnisse
1
Closed-loop simulation testing of a probabilistic DR framew..:
, In:
2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE)
,
Van Der Heijden, Ties
;
Palensky, Peter
;
Van De Giesen, Nick
. - p. 1-6 , 2023
Link:
https://doi.org/10.1109/ISIE51358.2023.10227921
RT T1
2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE)
: T1
Closed-loop simulation testing of a probabilistic DR framework for Day Ahead Market participation applied to Battery Energy Storage Systems
UL https://suche.suub.uni-bremen.de/peid=ieee-10227921&Exemplar=1&LAN=DE A1 Van Der Heijden, Ties A1 Palensky, Peter A1 Van De Giesen, Nick A1 Abraham, Edo YR 2023 SN 2163-5145 K1 Costs K1 Uncertainty K1 Dams K1 Shape K1 Time series analysis K1 Stochastic processes K1 Probabilistic logic K1 Demand Response K1 probabilistic forecasting K1 scenario generation K1 stochastic programming K1 battery energy storage systems K1 day ahead market SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ISIE51358.2023.10227921 DO https://doi.org/10.1109/ISIE51358.2023.10227921 SF ELIB - SuUB Bremen
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