I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Closed-loop simulation testing of a probabilistic DR framew..:

, In: 2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE),
Van Der Heijden, Ties ; Palensky, Peter ; Van De Giesen, Nick. - p. 1-6 , 2023
Link: https://doi.org/10.1109/ISIE51358.2023.10227921