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1
Degradation Detection of Series-Connected Li-ion based ESS ..:
, In:
2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE)
,
Lee, Hyeong Min
;
Shin, Yong-June
- p. 1-6 , 2023
Link:
https://doi.org/10.1109/ISIE51358.2023.10227938
RT T1 <cTitle>2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE)</cTitle>: T1 <Title>Degradation Detection of Series-Connected Li-ion based ESS via Time Domain Reflectometry</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10227938&Exemplar=1&LAN=DE A1 Lee, Hyeong Min A1 Shin, Yong-June YR 2023 SN 2163-5145 K1 Degradation K1 Lithium-ion batteries K1 Impedance measurement K1 Thermal factors K1 Aging K1 Reflectometry K1 Impedance K1 Electrical circuit model K1 lithium-ion battery degradation K1 lithium-ion battery diagnosis K1 monitoring parameter K1 time domain reflectometry SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ISIE51358.2023.10227938 DO https://doi.org/10.1109/ISIE51358.2023.10227938 SF ELIB - SuUB Bremen
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