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1 Ergebnisse
1
Embedded Intelligence of End Devices with MOS Sensors for C..:
, In:
2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE)
,
Leite, Simao
;
Costa, Rui
;
Carvalho, Joao
... - p. 1-5 , 2023
Link:
https://doi.org/10.1109/ISIE51358.2023.10228140
RT T1 <cTitle>2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE)</cTitle>: T1 <Title>Embedded Intelligence of End Devices with MOS Sensors for CH4 Detection</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10228140&Exemplar=1&LAN=DE A1 Leite, Simao A1 Costa, Rui A1 Carvalho, Joao A1 Sapage, Tomas A1 Bessa, Rui A1 Paiva, Sofia YR 2023 SN 2163-5145 K1 Temperature sensors K1 Temperature distribution K1 Power demand K1 Costs K1 Sensor phenomena and characterization K1 Sensor fusion K1 Sensor systems K1 CH4 detection K1 machine learning K1 MOS sensors K1 tinyML SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ISIE51358.2023.10228140 DO https://doi.org/10.1109/ISIE51358.2023.10228140 SF ELIB - SuUB Bremen
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