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Developing a Test Suite for Evaluating IEC 61499 Applicatio..:

, In: 2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE),
Xavier, Midhun ; Laikh, Tatiana ; Patil, Sandeep. - p. 1-4 , 2023
Link: https://doi.org/10.1109/ISIE51358.2023.10228154