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1 Ergebnisse
1
Difficulty and Severity-Oriented Metrics for Test Prioritiz..:
, In:
2023 IEEE International Conference On Artificial Intelligence Testing (AITest)
,
Al-Qadasi, Hamzah
;
Falcone, Ylies
;
Bensalem, Saddek
- p. 40-48 , 2023
Link:
https://doi.org/10.1109/AITest58265.2023.00015
RT T1
2023 IEEE International Conference On Artificial Intelligence Testing (AITest)
: T1
Difficulty and Severity-Oriented Metrics for Test Prioritization in Deep Learning Systems
UL https://suche.suub.uni-bremen.de/peid=ieee-10229445&Exemplar=1&LAN=DE A1 Al-Qadasi, Hamzah A1 Falcone, Ylies A1 Bensalem, Saddek YR 2023 SN 2835-3560 K1 Measurement K1 Deep learning K1 Costs K1 Fault detection K1 Market research K1 Labeling K1 Artificial intelligence K1 Test Prioritization Algorithms K1 Evaluation Metrics K1 Severity Prioritization K1 Effective Labeling SP 40 OP 48 LK http://dx.doi.org/https://doi.org/10.1109/AITest58265.2023.00015 DO https://doi.org/10.1109/AITest58265.2023.00015 SF ELIB - SuUB Bremen
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