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Characteristics Fluctuation of Sub-3-nm Bulk FinFET Devices..:

, In: 2023 IEEE 23rd International Conference on Nanotechnology (NANO),
Kola, Sekhar Reddy ; Chuang, Min-Hui ; Li, Yiming - p. 917-922 , 2023
Link: https://doi.org/10.1109/NANO58406.2023.10231216