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Assessing the Role of Dielectric Phase Defects in Doped Fer..:

, In: 2023 IEEE 23rd International Conference on Nanotechnology (NANO),
Sritharan, Mayuri ; Lee, Hyunjae ; Yoon, Youngki - p. 305-310 , 2023
Link: https://doi.org/10.1109/NANO58406.2023.10231224