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AFM Imaging Defect Detection and Classification with Artifi..:

, In: 2023 IEEE 23rd International Conference on Nanotechnology (NANO),
Zhang, Juntao ; Ren, Juan ; Hu, Shuiqing - p. 447-452 , 2023
Link: https://doi.org/10.1109/NANO58406.2023.10231258