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Correlation Model for Size Measurement of Nanoparticles by ..:

, In: 2023 IEEE 23rd International Conference on Nanotechnology (NANO),
Shim, Jimin ; Park, Y. H. ; Yim, Yong-Hyeon.. - p. 227-232 , 2023
Link: https://doi.org/10.1109/NANO58406.2023.10231313