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1 Ergebnisse
1
Butt-Coupling Optical Probe Card for Wafer-Scale Photonic-I..:
, In:
2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)
,
Wu, Cheng-Yu
;
Lee, Ming-Chang M.
;
Lu, Mei-Ju
... - p. 1-1 , 2023
Link:
https://doi.org/10.1109/CLEO/Europe-EQEC57999.2023.102..
RT T1 <cTitle>2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)</cTitle>: T1 <Title>Butt-Coupling Optical Probe Card for Wafer-Scale Photonic-Integrated-Circuits Test with Polarization Control</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10231407&Exemplar=1&LAN=DE A1 Wu, Cheng-Yu A1 Lee, Ming-Chang M. A1 Lu, Mei-Ju A1 Mu, Sin-Yuan A1 Chen, Jihan A1 Cheng, Chia-Sheng YR 2023 SN 2833-1052 K1 Couplings K1 Optical fiber polarization K1 Optical polarization K1 Image edge detection K1 Optical device fabrication K1 Optical imaging K1 Probes SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/CLEO/Europe-EQEC57999.2023.10231407 DO https://doi.org/10.1109/CLEO/Europe-EQEC57999.2023.10231407 SF ELIB - SuUB Bremen
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