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1 Ergebnisse
1
Hidden in Plain Sight: A Detailed Investigation of Selectiv..:
, In:
2023 IEEE International Test Conference India (ITC India)
,
Parvin, Sajjad
;
Jha, Chandan Kumar
;
Ahmadi-Pours, Sallar
.. - p. 1-6 , 2023
Link:
https://doi.org/10.1109/ITCIndia59034.2023.10235396
RT T1
2023 IEEE International Test Conference India (ITC India)
: T1
Hidden in Plain Sight: A Detailed Investigation of Selectively Increasing Local Density to Camouflage and Robustify Against Optical Probing Attacks
UL https://suche.suub.uni-bremen.de/peid=ieee-10235396&Exemplar=1&LAN=DE A1 Parvin, Sajjad A1 Jha, Chandan Kumar A1 Ahmadi-Pours, Sallar A1 Torres, Frank Sill A1 Drechsler, Rolf YR 2023 SN 2833-8391 K1 Optical device fabrication K1 Layout K1 Voltage K1 Logic gates K1 Reflection K1 Libraries K1 Inverters K1 Optical Probing K1 Security K1 Local Density K1 Place and Route K1 PnR SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ITCIndia59034.2023.10235396 DO https://doi.org/10.1109/ITCIndia59034.2023.10235396 SF ELIB - SuUB Bremen
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