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1 Ergebnisse
1
Addressing Physically Aware Diagnosis Challenges in Hierarc..:
, In:
2023 IEEE International Test Conference India (ITC India)
,
Nandakumar, Bharath
;
Chillarige, Sameer
;
L'Esperance, Nicholai
.. - p. 1-8 , 2023
Link:
https://doi.org/10.1109/ITCIndia59034.2023.10235457
RT T1
2023 IEEE International Test Conference India (ITC India)
: T1
Addressing Physically Aware Diagnosis Challenges in Hierarchical Core Based Designs
UL https://suche.suub.uni-bremen.de/peid=ieee-10235457&Exemplar=1&LAN=DE A1 Nandakumar, Bharath A1 Chillarige, Sameer A1 L'Esperance, Nicholai A1 Zimmerman, Jeff A1 Redburn, Robert YR 2023 SN 2833-8391 K1 Costs K1 Scalability K1 Pipelines K1 Discrete Fourier transforms K1 Automatic test pattern generation K1 VLSI K1 core-based designs K1 physical diagnostics K1 yield K1 volume diagnosis K1 scalability SP 1 OP 8 LK http://dx.doi.org/https://doi.org/10.1109/ITCIndia59034.2023.10235457 DO https://doi.org/10.1109/ITCIndia59034.2023.10235457 SF ELIB - SuUB Bremen
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