I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Discussion of single event effect (SEE) influence and prote..:
, In:
2023 IEEE 18th Conference on Industrial Electronics and Applications (ICIEA)
,
YuChen
;
WeiZhang
;
YafeiYou
.. - p. 1551-1555 , 2023
Link:
https://doi.org/10.1109/ICIEA58696.2023.10241497
RT T1 <cTitle>2023 IEEE 18th Conference on Industrial Electronics and Applications (ICIEA)</cTitle>: T1 <Title>Discussion of single event effect (SEE) influence and protection design strategy in avionics</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10241497&Exemplar=1&LAN=DE A1 YuChen A1 WeiZhang A1 YafeiYou A1 MingLi A1 YunFu YR 2023 SN 2158-2297 K1 Industrial electronics K1 Fault tolerance K1 Particle beams K1 Satellites K1 Fault tolerant systems K1 Single event upsets K1 Receivers K1 avionics K1 line-replaceable unit(LRU) K1 atmospheric radiation K1 neutron included single event effect (NSEE) K1 SEE inducedfailure rate K1 SEE rate SP 1551 OP 1555 LK http://dx.doi.org/https://doi.org/10.1109/ICIEA58696.2023.10241497 DO https://doi.org/10.1109/ICIEA58696.2023.10241497 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
