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1 Ergebnisse
1
Discussion of single event effect (SEE) influence and prote..:
, In:
2023 IEEE 18th Conference on Industrial Electronics and Applications (ICIEA)
,
YuChen
;
WeiZhang
;
YafeiYou
.. - p. 1551-1555 , 2023
Link:
https://doi.org/10.1109/ICIEA58696.2023.10241497
RT T1
2023 IEEE 18th Conference on Industrial Electronics and Applications (ICIEA)
: T1
Discussion of single event effect (SEE) influence and protection design strategy in avionics
UL https://suche.suub.uni-bremen.de/peid=ieee-10241497&Exemplar=1&LAN=DE A1 YuChen A1 WeiZhang A1 YafeiYou A1 MingLi A1 YunFu YR 2023 SN 2158-2297 K1 Industrial electronics K1 Fault tolerance K1 Particle beams K1 Satellites K1 Fault tolerant systems K1 Single event upsets K1 Receivers K1 avionics K1 line-replaceable unit(LRU) K1 atmospheric radiation K1 neutron included single event effect (NSEE) K1 SEE inducedfailure rate K1 SEE rate SP 1551 OP 1555 LK http://dx.doi.org/https://doi.org/10.1109/ICIEA58696.2023.10241497 DO https://doi.org/10.1109/ICIEA58696.2023.10241497 SF ELIB - SuUB Bremen
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