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1 Ergebnisse
1
Power Supply Induced Jitter (PSIJ) Modeling, Analysis, and ..:
, In:
2023 IEEE Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMC+SIPI)
,
Park, Hyunwook
;
Shin, Taein
;
Kim, Seongguk
... - p. 125-130 , 2023
Link:
https://doi.org/10.1109/EMCSIPI50001.2023.10241680
RT T1 <cTitle>2023 IEEE Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMC+SIPI)</cTitle>: T1 <Title>Power Supply Induced Jitter (PSIJ) Modeling, Analysis, and Optimization of High Bandwidth Memory (HBM) I/O Interface</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10241680&Exemplar=1&LAN=DE A1 Park, Hyunwook A1 Shin, Taein A1 Kim, Seongguk A1 Son, Keeyoung A1 Kim, Keunwoo A1 Sim, Boogyo A1 Kang, Hyungmin A1 Choi, Seonguk A1 Yoon, Jiwon A1 Kim, Hyunwoo A1 Hwang, Chulsoon A1 Kim, Joungho YR 2023 K1 Analytical models K1 Sensitivity K1 Power supplies K1 Frequency-domain analysis K1 Bandwidth K1 Switches K1 Jitter K1 I/O interface K1 High bandwidth memory K1 Power Supply Induced Jitter SP 125 OP 130 LK http://dx.doi.org/https://doi.org/10.1109/EMCSIPI50001.2023.10241680 DO https://doi.org/10.1109/EMCSIPI50001.2023.10241680 SF ELIB - SuUB Bremen
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