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1 Ergebnisse
1
Signal Integrity Analysis of Notch-Routing to Reduce Near-E..:
, In:
2023 IEEE Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMC+SIPI)
,
Ryu, Seunghun
;
Kim, Hyunwoong
;
Lee, Seonghi
... - p. 131-136 , 2023
Link:
https://doi.org/10.1109/EMCSIPI50001.2023.10241697
RT T1 <cTitle>2023 IEEE Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMC+SIPI)</cTitle>: T1 <Title>Signal Integrity Analysis of Notch-Routing to Reduce Near-End Crosstalk for Tightly Coupled and Short Microstrip Channel</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10241697&Exemplar=1&LAN=DE A1 Ryu, Seunghun A1 Kim, Hyunwoong A1 Lee, Seonghi A1 Park, Dongryul A1 Lee, Sanguk A1 Ahn, Seungyoung YR 2023 K1 Couplings K1 Power transmission lines K1 Costs K1 Crosstalk K1 Pins K1 Microstrip K1 Impedance K1 Far-end crosstalk K1 insertion loss K1 microstrip K1 near-end crosstalk K1 notch-routing SP 131 OP 136 LK http://dx.doi.org/https://doi.org/10.1109/EMCSIPI50001.2023.10241697 DO https://doi.org/10.1109/EMCSIPI50001.2023.10241697 SF ELIB - SuUB Bremen
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