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1 Ergebnisse
1
Near-Field EMI Analysis of LPDDR5 DRAM at idle mode:
, In:
2023 IEEE Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMC+SIPI)
,
Kim, Jun-Bae
;
Kwon, Chang Ki
;
Kim, Taeho
... - p. 311-314 , 2023
Link:
https://doi.org/10.1109/EMCSIPI50001.2023.10241742
RT T1 <cTitle>2023 IEEE Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMC+SIPI)</cTitle>: T1 <Title>Near-Field EMI Analysis of LPDDR5 DRAM at idle mode</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10241742&Exemplar=1&LAN=DE A1 Kim, Jun-Bae A1 Kwon, Chang Ki A1 Kim, Taeho A1 Park, Sangwook A1 Sung, Yoo-Chang A1 Ihm, Jeong Don A1 Bae, Seung-Jun A1 Kim, Jingook YR 2023 K1 Semiconductor device measurement K1 Current measurement K1 Simulation K1 Electromagnetic interference K1 Printed circuits K1 Random access memory K1 Power system harmonics K1 EMI K1 RDL K1 Power Planes K1 Common Mode Currents K1 LPDDR5 SP 311 OP 314 LK http://dx.doi.org/https://doi.org/10.1109/EMCSIPI50001.2023.10241742 DO https://doi.org/10.1109/EMCSIPI50001.2023.10241742 SF ELIB - SuUB Bremen
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