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1 Ergebnisse
1
Investigation of Off-state Stress Time-Dependent Dynamic On..:
, In:
2023 IEEE 18th Conference on Industrial Electronics and Applications (ICIEA)
,
Li, Yao
;
Tang, Hui
;
Zhang, Ke
... - p. 965-968 , 2023
Link:
https://doi.org/10.1109/ICIEA58696.2023.10241866
RT T1 <cTitle>2023 IEEE 18th Conference on Industrial Electronics and Applications (ICIEA)</cTitle>: T1 <Title>Investigation of Off-state Stress Time-Dependent Dynamic On-resistance of Commercial High Voltage GaN HEMTs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10241866&Exemplar=1&LAN=DE A1 Li, Yao A1 Tang, Hui A1 Zhang, Ke A1 Ni, Yiqiang A1 He, Liang A1 He, Zhiyuan A1 Shi, Yijun A1 Liu, Jun YR 2023 SN 2158-2297 K1 Degradation K1 Industrial electronics K1 Voltage K1 High-voltage techniques K1 HEMTs K1 Logic gates K1 Turning K1 GaN HEMTs K1 dynamic on-resistance K1 off-state stress time SP 965 OP 968 LK http://dx.doi.org/https://doi.org/10.1109/ICIEA58696.2023.10241866 DO https://doi.org/10.1109/ICIEA58696.2023.10241866 SF ELIB - SuUB Bremen
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