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1 Ergebnisse
1
I-V Global Parameter Extraction for Industry Standard FinFE..:
, In:
2023 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)
,
Chavez, Fredo
;
Chen, Jen-Hao
;
Tung, Chien-Ting
.. - p. 20-22 , 2023
Link:
https://doi.org/10.1109/RFIT58767.2023.10243373
RT T1
2023 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)
: T1
I-V Global Parameter Extraction for Industry Standard FinFET Compact Model using Deep Learning
UL https://suche.suub.uni-bremen.de/peid=ieee-10243373&Exemplar=1&LAN=DE A1 Chavez, Fredo A1 Chen, Jen-Hao A1 Tung, Chien-Ting A1 Hu, Chenming A1 Khandelwal, Sourabh YR 2023 SN 2836-3825 K1 Deep learning K1 Industries K1 Market research K1 FinFETs K1 Data models K1 Pollution measurement K1 Manufacturing K1 Parameter Extraction K1 Berkeley Short-channel IGFET Model – Common Multi-Gate (BSIM-CMG) K1 fin field-effect transistor (FinFET) K1 deep learning K1 compact model SP 20 OP 22 LK http://dx.doi.org/https://doi.org/10.1109/RFIT58767.2023.10243373 DO https://doi.org/10.1109/RFIT58767.2023.10243373 SF ELIB - SuUB Bremen
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