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1 Ergebnisse
1
Crop Yield Prediction Based on Machine Learning Techniques:
, In:
2023 International Conference on Circuit Power and Computing Technologies (ICCPCT)
,
Sailaja, M.
;
Lalitha Kumari, G.
;
Pinninti, Monika Sai
... - p. 1335-1341 , 2023
Link:
https://doi.org/10.1109/ICCPCT58313.2023.10245132
RT T1 <cTitle>2023 International Conference on Circuit Power and Computing Technologies (ICCPCT)</cTitle>: T1 <Title>Crop Yield Prediction Based on Machine Learning Techniques</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10245132&Exemplar=1&LAN=DE A1 Sailaja, M. A1 Lalitha Kumari, G. A1 Pinninti, Monika Sai A1 Rupaswi, Mandava A1 Ram Santhosh Reddy, Kallam A1 Kodeboyina, Uday Kiran A1 Koteswara Rao, K. A1 Surekha, Y YR 2023 K1 Support vector machines K1 Crops K1 Production K1 Soil K1 Feature extraction K1 Ensemble learning K1 Security K1 crop yield prediction K1 machine learning K1 linear regression K1 polynomial regression K1 random forest regression K1 gradient boosted tree regression K1 nearest neighbor regression K1 support vector regression K1 feature selection techniques SP 1335 OP 1341 LK http://dx.doi.org/https://doi.org/10.1109/ICCPCT58313.2023.10245132 DO https://doi.org/10.1109/ICCPCT58313.2023.10245132 SF ELIB - SuUB Bremen
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