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1 Ergebnisse
1
Power Side-Channel Vulnerability Assessment of Lightweight ..:
, In:
2023 60th ACM/IEEE Design Automation Conference (DAC)
,
Golder, Anupam
;
Das, Debayan
;
Ghosh, Santosh
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/DAC56929.2023.10247916
RT T1
2023 60th ACM/IEEE Design Automation Conference (DAC)
: T1
Power Side-Channel Vulnerability Assessment of Lightweight Cryptographic Scheme, XOODYAK
UL https://suche.suub.uni-bremen.de/peid=ieee-10247916&Exemplar=1&LAN=DE A1 Golder, Anupam A1 Das, Debayan A1 Ghosh, Santosh A1 Varna, Avinash A1 Sabbagh, Majid A1 Ray, Sayak A1 Elnaggar, Rana A1 Friel, Joseph A1 Dinu, Daniel A1 Fung, Jason M. YR 2023 K1 Training K1 Analytical models K1 Design automation K1 Correlation K1 Absorption K1 Process control K1 Encryption K1 Lightweight Cryptography K1 Power Side-Channel Analysis K1 XOODYAK K1 Correlation Power Analysis K1 attack models K1 Multi-Tenant FPGA SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/DAC56929.2023.10247916 DO https://doi.org/10.1109/DAC56929.2023.10247916 SF ELIB - SuUB Bremen
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