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1 Ergebnisse
1
Novel Non-Destructive Physical Bitmap Verification Techniqu..:
, In:
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Choo, Shengzi
;
Atiqah Supaat, Noor Iza
;
Sheng Foo, Loke
.. - p. 1-8 , 2023
Link:
https://doi.org/10.1109/IPFA58228.2023.10249047
RT T1
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
: T1
Novel Non-Destructive Physical Bitmap Verification Technique on SRAM and NOR Flash
UL https://suche.suub.uni-bremen.de/peid=ieee-10249047&Exemplar=1&LAN=DE A1 Choo, Shengzi A1 Atiqah Supaat, Noor Iza A1 Sheng Foo, Loke A1 Liew, Chik Hooi A1 Lee, Jason YR 2023 SN 1946-1550 K1 Integrated circuits K1 Laser theory K1 Correlation K1 Random access memory K1 Failure analysis K1 Circuit faults K1 physical bitmap verification K1 non-destructive K1 optical fault isolation K1 memory K1 NVM K1 SRAM K1 NOR flash K1 PEM K1 EOFM K1 OBIRCH SP 1 OP 8 LK http://dx.doi.org/https://doi.org/10.1109/IPFA58228.2023.10249047 DO https://doi.org/10.1109/IPFA58228.2023.10249047 SF ELIB - SuUB Bremen
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