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1 Ergebnisse
1
No-Reference Image Quality Assessment for Reverse Engineeri..:
, In:
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Bette, Ann-Christin
;
Falter, Robin
;
Ludwig, Matthias
... - p. 1-9 , 2023
Link:
https://doi.org/10.1109/IPFA58228.2023.10249049
RT T1 <cTitle>2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)</cTitle>: T1 <Title>No-Reference Image Quality Assessment for Reverse Engineering of Integrated Circuits</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10249049&Exemplar=1&LAN=DE A1 Bette, Ann-Christin A1 Falter, Robin A1 Ludwig, Matthias A1 Lippmann, Bernhard A1 Siegelin, Frank A1 Egger, Peter A1 Knoll, Alois YR 2023 SN 1946-1550 K1 Image quality K1 Scanning electron microscopy K1 Machine learning algorithms K1 Layout K1 Reverse engineering K1 Metals K1 Failure analysis K1 IC reverse engineering K1 Physical inspection K1 No-reference image quality assessment K1 IC image analysis K1 SEM imaging K1 Layout validation SP 1 OP 9 LK http://dx.doi.org/https://doi.org/10.1109/IPFA58228.2023.10249049 DO https://doi.org/10.1109/IPFA58228.2023.10249049 SF ELIB - SuUB Bremen
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