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Research on the Functional Failure of Large Scale Chips Cau..:

, In: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Chao, Shuanshe ; Lin, Xinyi ; Wei, Xixiong... - p. 1-5 , 2023
Link: https://doi.org/10.1109/IPFA58228.2023.10249050