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Defect localization on operating condition failure of 3D NA..:

, In: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Gan, Yong Yang ; Cheng Lim, Yong ; Loke, Bee Chin - p. 1-5 , 2023
Link: https://doi.org/10.1109/IPFA58228.2023.10249052