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Recovered Scan Failure Investigation and Failure Mechanism ..:

, In: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Sheng, Foo Loke ; Thin Wei, Chua ; Teng, Tan Ley. - p. 1-7 , 2023
Link: https://doi.org/10.1109/IPFA58228.2023.10249095