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1 Ergebnisse
1
Study of moisture penetration in chip passivation layer by ..:
, In:
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Lois, Liao Jinzhi
;
Bisheng, Wang
;
Xi, Zhang
.. - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IPFA58228.2023.10249096
RT T1
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
: T1
Study of moisture penetration in chip passivation layer by deuterium oxide (D2O) isotope tracing technique
UL https://suche.suub.uni-bremen.de/peid=ieee-10249096&Exemplar=1&LAN=DE A1 Lois, Liao Jinzhi A1 Bisheng, Wang A1 Xi, Zhang A1 Younan, Hua A1 Xiaomin, Li YR 2023 SN 1946-1550 K1 Deuterium K1 Silicon compounds K1 Integrated circuits K1 Corrosion K1 Surface resistance K1 Moisture K1 Ions K1 Moisture penetration K1 deuterium oxide (D2O) K1 isotope K1 passivation layer SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IPFA58228.2023.10249096 DO https://doi.org/10.1109/IPFA58228.2023.10249096 SF ELIB - SuUB Bremen
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