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Ambient Dependent Degradation Behavior of Flexible Poly-Si ..:

, In: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Hu, Yang ; Zhou, Wenjuan ; Wang, Mingxiang... - p. 1-3 , 2023
Link: https://doi.org/10.1109/IPFA58228.2023.10249104