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Robust Image Processing Software for Void Calculation in Th..:

, In: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Song, Mei-Hui ; Oh, Zi-Ying ; Lee, Xi-Wen... - p. 1-8 , 2023
Link: https://doi.org/10.1109/IPFA58228.2023.10249157