I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
AlGaN/GaN RF Power Amplifier Failure Analysis and Backside ..:
, In:
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Shi, Lin
;
Wang, Chong
;
Cai, Xiaolong
.. - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IPFA58228.2023.10249172
RT T1
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
: T1
AlGaN/GaN RF Power Amplifier Failure Analysis and Backside Via Etching Process Improvement
UL https://suche.suub.uni-bremen.de/peid=ieee-10249172&Exemplar=1&LAN=DE A1 Shi, Lin A1 Wang, Chong A1 Cai, Xiaolong A1 Zheng, Xuefeng A1 Liu, Haijun YR 2023 SN 1946-1550 K1 Radio frequency K1 Grounding K1 Power amplifiers K1 Metals K1 Failure analysis K1 HEMTs K1 Etching K1 Doherty K1 AlGaN/GaN HEMT K1 failure analysis K1 via etching K1 reflow screening SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IPFA58228.2023.10249172 DO https://doi.org/10.1109/IPFA58228.2023.10249172 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)