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Investigations on the Light-Induced Degradation of P-Channe..:
, In:
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Zhang, Yin
;
Wang, Huaisheng
;
Wang, Mingxiang
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IPFA58228.2023.10249180
RT T1
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
: T1
Investigations on the Light-Induced Degradation of P-Channel Poly-Silicon Thin Film Transistors
UL https://suche.suub.uni-bremen.de/peid=ieee-10249180&Exemplar=1&LAN=DE A1 Zhang, Yin A1 Wang, Huaisheng A1 Wang, Mingxiang A1 Zhang, Dongli A1 Lv, Nannan A1 Shan, Qi YR 2023 SN 1946-1550 K1 Degradation K1 Integrated circuits K1 Hydrogen K1 Lighting K1 Failure analysis K1 Threshold voltage K1 Silicon K1 low-temperature polycrystalline silicon (LTPS) K1 thin-film transistors (TFTs) K1 red light illumination K1 light-induced degradation SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IPFA58228.2023.10249180 DO https://doi.org/10.1109/IPFA58228.2023.10249180 SF ELIB - SuUB Bremen
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