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1 Ergebnisse
1
Reliability study of the three-dimensional porous flexible ..:
, In:
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Shen, Junhao
;
Sun, Yuhan
;
Gong, Danni
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IPFA58228.2023.10249188
RT T1
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
: T1
Reliability study of the three-dimensional porous flexible resistive pressure sensor
UL https://suche.suub.uni-bremen.de/peid=ieee-10249188&Exemplar=1&LAN=DE A1 Shen, Junhao A1 Sun, Yuhan A1 Gong, Danni A1 Zheng, Xinyue A1 Zuo, Shaohua A1 Shi, Fuwen A1 Wu, Xing A1 Bi, Hengchang YR 2023 SN 1946-1550 K1 Pressure sensors K1 Integrated circuits K1 Human computer interaction K1 Three-dimensional displays K1 Wearable computers K1 Surface resistance K1 Loading K1 flexible pressure sensor K1 three-dimensional conductive sponge K1 device reliability SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IPFA58228.2023.10249188 DO https://doi.org/10.1109/IPFA58228.2023.10249188 SF ELIB - SuUB Bremen
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