I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Comparing U-Net and Mask R-CNN Algorithms for Deep Learning..:
, In:
2023 3rd International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME)
,
Agarwal, S.
;
Sawant, A.
;
Wong, Tommy
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/ICECCME57830.2023.10252280
RT T1 <cTitle>2023 3rd International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME)</cTitle>: T1 <Title>Comparing U-Net and Mask R-CNN Algorithms for Deep Learning-Based Segmentation of Electron Microscopy Images containing cavities for Nuclear Reactor Applications</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10252280&Exemplar=1&LAN=DE A1 Agarwal, S. A1 Sawant, A. A1 Wong, Tommy A1 Copp, S. E. A1 Reyes-Zacarias, J. A1 Zinkle, S. J. YR 2023 K1 Training K1 Image segmentation K1 Frequency modulation K1 Transmission electron microscopy K1 Training data K1 Computer architecture K1 Object detection K1 U-Net K1 Mask R-CNN K1 Deep Learning K1 Image Segmentation K1 Electron Microscopy SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICECCME57830.2023.10252280 DO https://doi.org/10.1109/ICECCME57830.2023.10252280 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
