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1 Ergebnisse
1
Read Disturb and Reliability: The Complete Story for 3D CT ..:
, In:
2023 IEEE 12th Non-Volatile Memory Systems and Applications Symposium (NVMSA)
,
Ren, Tianyu
;
Li, Qiao
;
Ye, Min
. - p. 1-6 , 2023
Link:
https://doi.org/10.1109/NVMSA58981.2023.00024
RT T1 <cTitle>2023 IEEE 12th Non-Volatile Memory Systems and Applications Symposium (NVMSA)</cTitle>: T1 <Title>Read Disturb and Reliability: The Complete Story for 3D CT NAND Flash</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10254389&Exemplar=1&LAN=DE A1 Ren, Tianyu A1 Li, Qiao A1 Ye, Min A1 Xue, Chun Jason YR 2023 SN 2575-257X K1 Three-dimensional displays K1 Nonvolatile memory K1 Stacking K1 Bit error rate K1 Switches K1 Behavioral sciences K1 Reliability K1 3D Charge Trap Flash Memory K1 Read Operations K1 Data Retention K1 P/E Cycling SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/NVMSA58981.2023.00024 DO https://doi.org/10.1109/NVMSA58981.2023.00024 SF ELIB - SuUB Bremen
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