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1 Ergebnisse
1
Reliability Analysis of Laminated Oxide/Metal/Oxide Flexibl..:
, In:
2023 IEEE International Flexible Electronics Technology Conference (IFETC)
,
Kao, Yu-Han
;
Chang, Hung-Shuo
;
Lin, Chiao-Chi
- p. 01-03 , 2023
Link:
https://doi.org/10.1109/IFETC57334.2023.10254833
RT T1 <cTitle>2023 IEEE International Flexible Electronics Technology Conference (IFETC)</cTitle>: T1 <Title>Reliability Analysis of Laminated Oxide/Metal/Oxide Flexible Conductors Through Cyclic Bending After Accelerated Weathering</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10254833&Exemplar=1&LAN=DE A1 Kao, Yu-Han A1 Chang, Hung-Shuo A1 Lin, Chiao-Chi YR 2023 K1 Resistance K1 Degradation K1 Temperature K1 Shape K1 Sociology K1 Failure analysis K1 Bending K1 oxide/metal/oxide (OMO) K1 flexible conductors K1 weathering K1 cyclic bending K1 Weibull analysis K1 surface cracking SP 01 OP 03 LK http://dx.doi.org/https://doi.org/10.1109/IFETC57334.2023.10254833 DO https://doi.org/10.1109/IFETC57334.2023.10254833 SF ELIB - SuUB Bremen
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