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Soft Measurement of 0.2mm Fineness Screen Residue Based on ..:

, In: 2023 IEEE 13th International Conference on CYBER Technology in Automation, Control, and Intelligent Systems (CYBER),
Wang, Feiyu ; Yu, Hongliang ; Feng, Qizhe - p. 433-437 , 2023
Link: https://doi.org/10.1109/CYBER59472.2023.10256610