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A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM A..:

, In: 2023 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI),
Marques, Cleiton M. ; Brendler, Leonardo H. ; Wrobel, Frederic... - p. 1-6 , 2023
Link: https://doi.org/10.1109/SBCCI60457.2023.10261665